TOF-SIMS

The Business Line Automotive is accredited to carry out TOF-SIMS analyses. For several years now we have successfully employed this technology together with a competent partner to solve many different industrial technology problems.

Over the last years we have carried out several thousand TOF-SIMS analyses on different materials, media and products, and generally in combination with other test and analysis methods solved highly complex problems. Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is used as a highly sensitive detection method for the detection of all elements as well as the unequivocal identification of inorganic and especially organic compounds on the surface of any type of material. After special preparation of samples, the chemical composition of liquids, fats, gels, pastes, etc. can be determined as well as in the solid volume.

The detection limit can be as low as approx. 10-15 g/cm2 (1ppm of a molecule layer on the surface). Laterally resolved analyses (chemical mapping) are possible to the range of less as 1µm.

After special preparation of samples, the chemical composition of liquids, fats, gels, pastes, etc. can be determined as well as in the solid volume. The detection limit can be as low as approx. 10^-15 /cm² (1ppm of a molecule layer on the surface). Laterally resolved analyses (chemical mapping) are possible to the range of less as 1µm.

Our range of services:

• Identification of (organic) materials and their additives; trace analyses on solids and layers.
• Analysis of contamination on surfaces (e.g. „residual contamination“), evaluation of cleaning processes; quantitative analysis of silicones on material surfaces.
• Identifying the causes of embrittlement or softening of polymers.
• Clarifying the composition of oils, fats etc.
• Loss of adherence of layers.
• Joint problems (adhesives, soldering, welding)
• Determining the causes of malfunctions in electrical contacts.
• Comparative analysis of noble metal dispersion on catalysts.
• Identification of chemical compounds of individual particles.
• Direct comparison of the composition of the solids, liquids, etc. in a system.